Guangyi Lu, Yuan Wang, Jian Cao, Song Jia, Ganggang Zhang, Xing Zhang. Novel gate-voltage-bias techniques for gate-coupled MOS (GCMOS) ESD protection circuits. In IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.