Guangyi Lu, Yuan Wang, Lizhong Zhang, Yize Wang, Ru Huang, Xing Zhang 0002. Investigation on the Gate Bias Voltage of BigFET in Power-rail ESD Clamp Circuit for Enhanced Transient Noise Immunity. In IEEE International Symposium on Circuits and Systems, ISCAS 2018, 27-30 May 2018, Florence, Italy. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.