A Model-Based Framework to Assess the Reliability of Safety-Critical Applications

Lucas Matana Luza, Annachiara Ruospo, Alberto Bosio, Ernesto Sánchez 0001, Luigi Dilillo. A Model-Based Framework to Assess the Reliability of Safety-Critical Applications. In Muhammad Shafique 0001, Andreas Steininger, Lukás Sekanina, Milos Krstic, Goran Stojanovic, Vojtech Mrazek, editors, 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2021, Vienna, Austria, April 7-9, 2021. pages 41-44, IEEE, 2021. [doi]

Authors

Lucas Matana Luza

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Annachiara Ruospo

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Alberto Bosio

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Ernesto Sánchez 0001

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Luigi Dilillo

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