Lucas Matana Luza, Annachiara Ruospo, Alberto Bosio, Ernesto Sánchez 0001, Luigi Dilillo. A Model-Based Framework to Assess the Reliability of Safety-Critical Applications. In Muhammad Shafique 0001, Andreas Steininger, Lukás Sekanina, Milos Krstic, Goran Stojanovic, Vojtech Mrazek, editors, 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2021, Vienna, Austria, April 7-9, 2021. pages 41-44, IEEE, 2021. [doi]
Abstract is missing.