Lucas Matana Luza, Annachiara Ruospo, Alberto Bosio, Ernesto Sánchez 0001, Luigi Dilillo. A Model-Based Framework to Assess the Reliability of Safety-Critical Applications. In Muhammad Shafique 0001, Andreas Steininger, Lukás Sekanina, Milos Krstic, Goran Stojanovic, Vojtech Mrazek, editors, 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2021, Vienna, Austria, April 7-9, 2021. pages 41-44, IEEE, 2021. [doi]
@inproceedings{LuzaRB0D21,
title = {A Model-Based Framework to Assess the Reliability of Safety-Critical Applications},
author = {Lucas Matana Luza and Annachiara Ruospo and Alberto Bosio and Ernesto Sánchez 0001 and Luigi Dilillo},
year = {2021},
doi = {10.1109/DDECS52668.2021.9417059},
url = {https://doi.org/10.1109/DDECS52668.2021.9417059},
researchr = {https://researchr.org/publication/LuzaRB0D21},
cites = {0},
citedby = {0},
pages = {41-44},
booktitle = {24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2021, Vienna, Austria, April 7-9, 2021},
editor = {Muhammad Shafique 0001 and Andreas Steininger and Lukás Sekanina and Milos Krstic and Goran Stojanovic and Vojtech Mrazek},
publisher = {IEEE},
isbn = {978-1-6654-3595-6},
}