Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2 - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Xiaolei Ma, Xiangwei Jiang, Jiezhi Chen, Liwei Wang 0003, Yunfei En. Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]

This author has not been identified. Look up 'Xiaolei Ma' in GoogleThis author has not been identified. Look up 'Xiangwei Jiang' in GoogleThis author has not been identified. Look up 'Jiezhi Chen' in GoogleThis author has not been identified. Look up 'Liwei Wang 0003' in GoogleThis author has not been identified. Look up 'Yunfei En' in Google

runs on WebDSL