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Non-Conventional Faults in BiCMOS Digital Circuits

Siyad C. Ma, Edward J. McCluskey. Non-Conventional Faults in BiCMOS Digital Circuits. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 882-891, IEEE Computer Society, 1992.

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