Eric MacDonald, Nur A. Touba. Delay testing of partially depleted silicon-on-insulator (PD-SOI) circuits. IEEE Trans. VLSI Syst., 14(6):587-595, 2006. [doi]
@article{MacDonaldT06,
title = {Delay testing of partially depleted silicon-on-insulator (PD-SOI) circuits},
author = {Eric MacDonald and Nur A. Touba},
year = {2006},
doi = {10.1109/TVLSI.2006.878209},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2006.878209},
tags = {testing},
researchr = {https://researchr.org/publication/MacDonaldT06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {14},
number = {6},
pages = {587-595},
}