Riko I. Made, Yu Gao, Govindo J. Syaranamual, W. A. Sasangka, L. Zhang, Xuan Sang Nguyen, Y. Y. Tay, J. S. Herrin, Carl V. Thompson, Chee Lip Gan. Characterisation of defects generated during constant current InGaN-on-silicon LED operation. Microelectronics Reliability, 76:561-565, 2017. [doi]
@article{MadeGSSZNTHTG17,
title = {Characterisation of defects generated during constant current InGaN-on-silicon LED operation},
author = {Riko I. Made and Yu Gao and Govindo J. Syaranamual and W. A. Sasangka and L. Zhang and Xuan Sang Nguyen and Y. Y. Tay and J. S. Herrin and Carl V. Thompson and Chee Lip Gan},
year = {2017},
doi = {10.1016/j.microrel.2017.07.072},
url = {https://doi.org/10.1016/j.microrel.2017.07.072},
researchr = {https://researchr.org/publication/MadeGSSZNTHTG17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {561-565},
}