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Characterisation of defects generated during constant current InGaN-on-silicon LED operation

Riko I. Made, Yu Gao, Govindo J. Syaranamual, W. A. Sasangka, L. Zhang, Xuan Sang Nguyen, Y. Y. Tay, J. S. Herrin, Carl V. Thompson, Chee Lip Gan. Characterisation of defects generated during constant current InGaN-on-silicon LED operation. Microelectronics Reliability, 76:561-565, 2017. [doi]

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