A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology

Manasa Madhvaraj, Salvador Mir, Manuel J. Barragan. A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology. In 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, VLSI-SoC 2022, Patras, Greece, October 3-5, 2022. pages 1-6, IEEE, 2022. [doi]

@inproceedings{MadhvarajMB22,
  title = {A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology},
  author = {Manasa Madhvaraj and Salvador Mir and Manuel J. Barragan},
  year = {2022},
  doi = {10.1109/VLSI-SoC54400.2022.9939620},
  url = {https://doi.org/10.1109/VLSI-SoC54400.2022.9939620},
  researchr = {https://researchr.org/publication/MadhvarajMB22},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, VLSI-SoC 2022, Patras, Greece, October 3-5, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9005-4},
}