An Accumulator - Based Test-Per-Clock Scheme

Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick. An Accumulator - Based Test-Per-Clock Scheme. IEEE Trans. VLSI Syst., 19(6):1090-1094, 2011. [doi]

Authors

Dimitris Magos

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Ioannis Voyiatzis

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Steffen Tarnick

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