Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick. An Accumulator - Based Test-Per-Clock Scheme. IEEE Trans. VLSI Syst., 19(6):1090-1094, 2011. [doi]
@article{MagosVT11,
title = {An Accumulator - Based Test-Per-Clock Scheme},
author = {Dimitris Magos and Ioannis Voyiatzis and Steffen Tarnick},
year = {2011},
doi = {10.1109/TVLSI.2010.2043452},
url = {http://dx.doi.org/10.1109/TVLSI.2010.2043452},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/MagosVT11},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {19},
number = {6},
pages = {1090-1094},
}