An Accumulator - Based Test-Per-Clock Scheme

Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick. An Accumulator - Based Test-Per-Clock Scheme. IEEE Trans. VLSI Syst., 19(6):1090-1094, 2011. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.