Hamid Mahmoodi-Meimand, Saibal Mukhopadhyay, Kaushik Roy. Estimation of delay variations due to random-dopant fluctuations in nano-scaled CMOS circuits. In Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC 2004, Orlando, FL, USA, October 2004. pages 17-20, IEEE, 2004. [doi]
Abstract is missing.