Hamid Mahmoodi. Reliability enhancement of power gating transistor under time dependent dielectric breakdown. In Srinivas Katkoori, Matthew R. Guthaus, Ayse Kivilcim Coskun, Andreas Burg, Ricardo Reis, editors, 20th IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2012, Santa Cruz, CA, USA, October 7-10, 2012. pages 189-194, IEEE, 2012. [doi]
Abstract is missing.