A. M. Majid, David C. Keezer, Jayasanker Jayabalan, Mihai Rotaru. Multi-Gigahertz Testing of Wafer-Level Packaged Devices. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
@inproceedings{MajidKJR06, title = {Multi-Gigahertz Testing of Wafer-Level Packaged Devices}, author = {A. M. Majid and David C. Keezer and Jayasanker Jayabalan and Mihai Rotaru}, year = {2006}, doi = {10.1109/TEST.2006.297669}, url = {http://dx.doi.org/10.1109/TEST.2006.297669}, researchr = {https://researchr.org/publication/MajidKJR06}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006}, editor = {Scott Davidson and Anne Gattiker}, publisher = {IEEE}, isbn = {1-4244-0292-1}, }