A. M. Majid, David C. Keezer, Jayasanker Jayabalan, Mihai Rotaru. Multi-Gigahertz Testing of Wafer-Level Packaged Devices. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
No references recorded for this publication.
No citations of this publication recorded.