T. M. Mak, Debika Bhattacharya, Cheryl Prunty, Bob Roeder, Nermine Ramadan, Joel Ferguson, Jianlin Yu. Cache RAM inductive fault analysis with fab defect modeling. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 862-871, IEEE Computer Society, 1998. [doi]
@inproceedings{MakBPRRFY98,
title = {Cache RAM inductive fault analysis with fab defect modeling},
author = {T. M. Mak and Debika Bhattacharya and Cheryl Prunty and Bob Roeder and Nermine Ramadan and Joel Ferguson and Jianlin Yu},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930862abs.htm},
tags = {caching, modeling, analysis},
researchr = {https://researchr.org/publication/MakBPRRFY98},
cites = {0},
citedby = {0},
pages = {862-871},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}