Gated base structure for improved current gain in SiC bipolar technology

B. Gunnar Malm, Hossein Elahipanah, Arash Salemi, Mikael Östling. Gated base structure for improved current gain in SiC bipolar technology. In 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017. pages 122-125, IEEE, 2017. [doi]

Abstract

Abstract is missing.