Thermal-aware reliability analysis for platform FPGAs

Prasanth Mangalagiri, Sungmin Bae, Krishnan Ramakrishnan, Yuan Xie, Vijaykrishnan Narayanan. Thermal-aware reliability analysis for platform FPGAs. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 722-727, IEEE, 2008. [doi]

Abstract

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