A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits

Murari Mani, Anirudh Devgan, Michael Orshansky, Yaping Zhan. A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 26(10):1790-1802, 2007. [doi]

Abstract

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