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Bias-Dependent Variation in FinFET SRAM

Randy W. Mann, Meixiong Zhao, Oh-Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter. Bias-Dependent Variation in FinFET SRAM. IEEE Trans. VLSI Syst., 28(5):1341-1344, 2020. [doi]

Authors

Randy W. Mann

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Meixiong Zhao

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Oh-Sung Kwon

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Xi Cao

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Sanjay Parihar

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Muhammed Ahosan Ul Karim

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Jack M. Higman

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Joseph Versaggi

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Rick Carter

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