Randy W. Mann, Meixiong Zhao, Oh-Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter. Bias-Dependent Variation in FinFET SRAM. IEEE Trans. VLSI Syst., 28(5):1341-1344, 2020. [doi]
@article{MannZKCPKHVC20,
title = {Bias-Dependent Variation in FinFET SRAM},
author = {Randy W. Mann and Meixiong Zhao and Oh-Sung Kwon and Xi Cao and Sanjay Parihar and Muhammed Ahosan Ul Karim and Jack M. Higman and Joseph Versaggi and Rick Carter},
year = {2020},
doi = {10.1109/TVLSI.2020.2974202},
url = {https://doi.org/10.1109/TVLSI.2020.2974202},
researchr = {https://researchr.org/publication/MannZKCPKHVC20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {28},
number = {5},
pages = {1341-1344},
}