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Bias-Dependent Variation in FinFET SRAM

Randy W. Mann, Meixiong Zhao, Oh-Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter. Bias-Dependent Variation in FinFET SRAM. IEEE Trans. VLSI Syst., 28(5):1341-1344, 2020. [doi]

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