J. C. Martin, C. Maneux, N. Labat, A. Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin. 1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectronics Reliability, 43(9-11):1725-1730, 2003. [doi]
@article{MartinMLTRBKG03,
title = {1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses},
author = {J. C. Martin and C. Maneux and N. Labat and A. Touboul and Muriel Riet and S. Blayac and M. Kahn and Jean Godin},
year = {2003},
doi = {10.1016/S0026-2714(03)00340-8},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00340-8},
tags = {analysis, C++},
researchr = {https://researchr.org/publication/MartinMLTRBKG03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {9-11},
pages = {1725-1730},
}