1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses

J. C. Martin, C. Maneux, N. Labat, A. Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin. 1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectronics Reliability, 43(9-11):1725-1730, 2003. [doi]

Abstract

Abstract is missing.