The following publications are possibly variants of this publication:
- Reliability of submicron InGaAs/InP DHBT under thermal and electrical stressesG. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, C. Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin. mr, 51(9-11):1730-1735, 2011. [doi]
- Thermal aging model of InP/InGaAs/InP DHBTS. Ghosh, F. Marc, C. Maneux, B. Grandchamp, G. A. Koné, T. Zimmer. mr, 50(9-11):1554-1558, 2010. [doi]
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