A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs

Sotirios Matakias, Y. Tsiatouhas, Angela Arapoyanni, Themistoklis Haniotakis. A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs. J. Electronic Testing, 20(5):523-531, 2004. [doi]

Authors

Sotirios Matakias

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Y. Tsiatouhas

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Angela Arapoyanni

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Themistoklis Haniotakis

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