Sotirios Matakias, Y. Tsiatouhas, Angela Arapoyanni, Themistoklis Haniotakis. A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs. J. Electronic Testing, 20(5):523-531, 2004. [doi]
@article{MatakiasTAH04,
title = {A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs},
author = {Sotirios Matakias and Y. Tsiatouhas and Angela Arapoyanni and Themistoklis Haniotakis},
year = {2004},
doi = {10.1023/B:JETT.0000042516.12841.36},
url = {http://dx.doi.org/10.1023/B:JETT.0000042516.12841.36},
researchr = {https://researchr.org/publication/MatakiasTAH04},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {20},
number = {5},
pages = {523-531},
}