A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs

Sotirios Matakias, Y. Tsiatouhas, Angela Arapoyanni, Themistoklis Haniotakis. A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs. J. Electronic Testing, 20(5):523-531, 2004. [doi]

Abstract

Abstract is missing.