Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard. NAND flash testing: A preliminary study on actual defects. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
@inproceedings{MaurouxVBDGPG09,
title = {NAND flash testing: A preliminary study on actual defects},
author = {Pierre-Didier Mauroux and Arnaud Virazel and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Benoît Godard},
year = {2009},
doi = {10.1109/TEST.2009.5355898},
url = {http://dx.doi.org/10.1109/TEST.2009.5355898},
researchr = {https://researchr.org/publication/MaurouxVBDGPG09},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}