Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard. NAND flash testing: A preliminary study on actual defects. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
Abstract is missing.