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Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez. Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories. J. Electronic Testing, 28(2):215-228, 2012. [doi]

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