The Effectiveness of I::DDQ::, Functional and Scan Tests: How Many Fault Coverages Do We Need? - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang. The Effectiveness of I::DDQ::, Functional and Scan Tests: How Many Fault Coverages Do We Need?. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 168-177, IEEE Computer Society, 1992.

This author has not been identified. Look up 'Peter C. Maxwell' in GoogleThis author has not been identified. Look up 'Robert C. Aitken' in GoogleThis author has not been identified. Look up 'Vic Johansen' in GoogleThis author has not been identified. Look up 'Inshen Chiang' in Google

runs on WebDSL