Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang. The Effectiveness of I::DDQ::, Functional and Scan Tests: How Many Fault Coverages Do We Need?. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 168-177, IEEE Computer Society, 1992.
@inproceedings{MaxwellAJC92,
title = {The Effectiveness of I::DDQ::, Functional and Scan Tests: How Many Fault Coverages Do We Need?},
author = {Peter C. Maxwell and Robert C. Aitken and Vic Johansen and Inshen Chiang},
year = {1992},
tags = {test coverage, testing, C++, coverage},
researchr = {https://researchr.org/publication/MaxwellAJC92},
cites = {0},
citedby = {0},
pages = {168-177},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}