Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra. ELF-Murphy Data on Defects and Test Sets. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 16-22, IEEE Computer Society, 2004. [doi]
Abstract is missing.