Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Edward J. McCluskey, Chao-Wen Tseng. Stuck-fault tests vs. actual defects. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 336-343, IEEE Computer Society, 2000.
Abstract is missing.