Mie-Grüneisen Analysis of the Molecular Bonding States in Silica Which Impact Time-Dependent Dielectric Breakdown

J. W. McPherson. Mie-Grüneisen Analysis of the Molecular Bonding States in Silica Which Impact Time-Dependent Dielectric Breakdown. Microelectronics Reliability, 44(9-11):1491-1496, 2004. [doi]

Abstract

Abstract is missing.