Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui. Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. VLSI Syst., 29(6):1271-1284, 2021. [doi]
@article{MedeirosFWTPH21,
title = {Hard-to-Detect Fault Analysis in FinFET SRAMs},
author = {Guilherme Cardoso Medeiros and Moritz Fieback and Lizhou Wu and Mottaqiallah Taouil and Letícia Maria Bolzani Poehls and Said Hamdioui},
year = {2021},
doi = {10.1109/TVLSI.2021.3071940},
url = {https://doi.org/10.1109/TVLSI.2021.3071940},
researchr = {https://researchr.org/publication/MedeirosFWTPH21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {29},
number = {6},
pages = {1271-1284},
}