Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, LetÃcia Maria Bolzani Poehls, Said Hamdioui. Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. VLSI Syst., 29(6):1271-1284, 2021. [doi]
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