Hard-to-Detect Fault Analysis in FinFET SRAMs - researchr publication related

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Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui. Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. VLSI Syst., 29(6):1271-1284, 2021. [doi]

The following publications are possibly variants of this publication:

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMsGuilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui. ets 2019: 1-2 [doi]

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMsGuilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui. date 2020: 792-797 [doi]

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMsG. Cardoso Medeiros, Moritz Fieback, A. Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui. ets 2021: 1-6 [doi]

Defect Oriented Fault Analysis for SRAMRei-Fu Huang, Yung-Fa Chou, Cheng-Wen Wu. ats 2003: 256-261 [doi]

Improving the Detection of Undefined State Faults in FinFET SRAMsG. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui. dtis 2021: 1-6 [doi]

Degradation analysis of high performance 14nm FinFET SRAMDaniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor. date 2018: 201-206 [doi]

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