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LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits

Dale Meehl, Bassilios Petrakis, Ping Zhang. LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 2, IEEE Computer Society, 2012. [doi]

Authors

Dale Meehl

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Bassilios Petrakis

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Ping Zhang

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