Dale Meehl, Bassilios Petrakis, Ping Zhang. LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 2, IEEE Computer Society, 2012. [doi]
@inproceedings{MeehlPZ12,
title = {LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits},
author = {Dale Meehl and Bassilios Petrakis and Ping Zhang},
year = {2012},
doi = {10.1109/ATS.2012.24},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.24},
researchr = {https://researchr.org/publication/MeehlPZ12},
cites = {0},
citedby = {0},
pages = {2},
booktitle = {21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-4555-2},
}