External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits

Dale Meehl, Bassilios Petrakis, Ping Zhang. LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 2, IEEE Computer Society, 2012. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.

runs on