Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method - researchr publication authors

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Usha Sandeep Mehta, Niranjan M. Devashrayee, Kanker S. Dasgupta. Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method. In 2010 International Symposium on System on Chip, SoC 2010, Tampere, September 29-30, 2010. pages 1-7, IEEE, 2010. [doi]

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