Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method

Usha Sandeep Mehta, Niranjan M. Devashrayee, Kanker S. Dasgupta. Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method. In 2010 International Symposium on System on Chip, SoC 2010, Tampere, September 29-30, 2010. pages 1-7, IEEE, 2010. [doi]

@inproceedings{MehtaDD10-3,
  title = {Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method},
  author = {Usha Sandeep Mehta and Niranjan M. Devashrayee and Kanker S. Dasgupta},
  year = {2010},
  doi = {10.1109/ISSOC.2010.5625560},
  url = {https://doi.org/10.1109/ISSOC.2010.5625560},
  researchr = {https://researchr.org/publication/MehtaDD10-3},
  cites = {0},
  citedby = {0},
  pages = {1-7},
  booktitle = {2010 International Symposium on System on Chip, SoC 2010, Tampere, September 29-30, 2010},
  publisher = {IEEE},
  isbn = {978-1-4244-8279-5},
}