Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique

Anne Meixner, Jash Banik. Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 1043-1052, IEEE Computer Society, 1997.

Authors

Anne Meixner

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Jash Banik

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