Anne Meixner, Jash Banik. Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 1043-1052, IEEE Computer Society, 1997.
@inproceedings{MeixnerB97,
title = {Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique},
author = {Anne Meixner and Jash Banik},
year = {1997},
tags = {testing, design},
researchr = {https://researchr.org/publication/MeixnerB97},
cites = {0},
citedby = {0},
pages = {1043-1052},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}