Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique - researchr publication

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Anne Meixner, Jash Banik. Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 1043-1052, IEEE Computer Society, 1997.

Abstract is missing.

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